James Jacob

Publication Activity (10 Years)

Years Active: 1985-2016
Publications (10 Years): 1

Top Topics

Statistical Model

Parameter Estimation

Top Venues

Ecol. Informatics

Publications

Debabrata Ray, Mukunda Dev Behera, James Jacob
Improving spatial transferability of ecological niche model of Hevea brasiliensis using pooled occurrences of introduced ranges in two biogeographic regions of India. Ecol. Informatics 34 (2016)
Ananta K. Majhi, V. D. Agrawak, James Jacob, Lalit M. Patnaik
Line coverage of path delay faults. IEEE Trans. Very Large Scale Integr. Syst. 8 (5) (2000)
Pramit Chavda, James Jacob, Vishwani D. Agrawal
Optimizing Logic Design Using Boolean Transforms. VLSI Design (1998)
P. Srinivasa Rao, James Jacob
A Fast Two-level Logic Minimizer. VLSI Design (1998)
James Jacob, P. Srinivas Sivakumar, Vishwani D. Agrawal
Adder and Comparator Synthesis with Exclusive-OR Transform of Inputs. VLSI Design (1997)
Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal
Functional test generation for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15 (7) (1996)
Nripendra N. Biswas, C. Srikanth, James Jacob
Cubical CAMP for minimization of Boolean functions. VLSI Design (1996)
Anil K. Chaudhay, Jacob Augustine, James Jacob
Lossless Compression Of Images Using Logic Minimization. ICIP (1) (1996)
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal
On test coverage of path delay faults. VLSI Design (1996)
Ananta K. Majhi, James Jacob, Lalit M. Patnaik
A Novel Path Delay Fault Simulator Using Binary Logic. VLSI Design 4 (3) (1996)
Jacob Augustine, Wen Feng, James Jacob
Logic minimization based approach for compressing image data. VLSI Design (1995)
Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal
Functional test generation for non-scan sequential circuits. VLSI Design (1995)
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal
An efficient automatic test generation system for path delay faults in combinational circuits. VLSI Design (1995)
Jacob Augustine, Wen Feng, Anamitra Makur, James Jacob
Switching theoretic approach to image compression. Signal Process. 44 (2) (1995)
P. R. Suresh Kumar, James Jacob, Mandyam-Komar Srinivas, Vishwani D. Agrawal
An Improved Deductive Fault Simulator. VLSI Design (1994)
P. R. Suresh Kumar, Mandyam-Komar Srinivas, James Jacob
Efficient Technique to Reduce Gate Evaluations and Speed Up Fault Simulation. VLSI Design (1993)
James Jacob, Vishwani D. Agrawal
Multiple fault detection in two-level multi-output circuits. J. Electron. Test. 3 (2) (1992)
Oommen Tharakan, James Jacob, Mandyam-Komar Srinivas
An Efficient Rule Based Fault Simulator. VLSI Design (1992)
James Jacob, Vishwani D. Agrawal
Functional Test Generation for Sequential Circuits. VLSI Design (1992)
Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal
Finite State Machine Testing Based on Growth and Dissappearance Faults. FTCS (1992)
James Jacob, Nripendra N. Biswas
Further Comments on "Detection of Faults in Programmable Logic Arrays". IEEE Trans. Computers 39 (1) (1990)
James Jacob, Nripendra N. Biswas
: A Testable PLA Design with Minimal Hardware and Test Set. ITC (1985)