On test coverage of path delay faults.

Ananta K. Majhi James Jacob Lalit M. Patnaik Vishwani D. Agrawal

Published in: VLSI Design (1996)

Keyphrases

test cases
test suite
set of test cases
shortest path
test data
software testing
path length
mutation testing
real time
information systems
database systems
fault detection
built in self test