Login / Signup
Functional test generation for synchronous sequential circuits.
Mandyam-Komar Srinivas
James Jacob
Vishwani D. Agrawal
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
</>
test generation
test cases
test sequences
symbolic execution
static analysis
mutation testing
quality assurance
high speed
design automation
software testing
artificial intelligence
image data
cooperative
circuit design
multi agent
case study
test data generation
delay insensitive
learning algorithm