Functional test generation for non-scan sequential circuits.
Mandyam-Komar SrinivasJames JacobVishwani D. AgrawalPublished in: VLSI Design (1995)
Keyphrases
- test generation
- test cases
- design automation
- test sequences
- symbolic execution
- static analysis
- quality assurance
- mutation testing
- regression testing
- software testing
- code coverage
- test data generation
- circuit design
- data sets
- quality control
- error rate
- vision system
- information technology
- high quality
- training data
- e learning
- artificial intelligence
- machine learning
- databases