Efficient Technique to Reduce Gate Evaluations and Speed Up Fault Simulation.
P. R. Suresh KumarMandyam-Komar SrinivasJames JacobPublished in: VLSI Design (1993)
Keyphrases
- neural network
- data mining
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- significantly reduced
- fault detection
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- fuzzy logic
- simulation models
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- cost effective
- database
- artificial neural networks
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- learning algorithm
- genetic algorithm
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