Functional Test Generation for Sequential Circuits.
James JacobVishwani D. AgrawalPublished in: VLSI Design (1992)
Keyphrases
- test generation
- test cases
- test sequences
- static analysis
- symbolic execution
- design automation
- quality assurance
- high speed
- mutation testing
- test data generation
- error rate
- delay insensitive
- computer vision
- code coverage
- software testing
- relational databases
- information technology
- feature space
- database systems
- real world