J. S. Yuan

Publication Activity (10 Years)

Years Active: 1988-2014
Publications (10 Years): 0

Top Topics

Design Processes

Reliability Assessment

Room Temperature

Top Venues

Microelectron. Reliab.

Publications

J. S. Yuan, S. Chen
Power amplifier resilient design for process and temperature variations using an on-chip PLL sensing signal. Microelectron. Reliab. 54 (1) (2014)
S. L. Jang, J. S. Yuan, S. D. Yen, E. Kritchanchai, G. W. Huang
Experimental evaluation of hot electron reliability on differential Clapp-VCO. Microelectron. Reliab. 53 (2) (2013)
J. S. Yuan, E. Kritchanchai
Power amplifier resilient design for process, voltage, and temperature variations. Microelectron. Reliab. 53 (6) (2013)
H. D. Yen, J. S. Yuan, R. L. Wang, G. W. Huang, W. K. Yeh, F. S. Huang
RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments. Microelectron. Reliab. 52 (11) (2012)
Chuanzhao Yu, J. S. Yuan, Enjun Xiao
Dynamic voltage stress effects on nMOS varactor. Microelectron. Reliab. 46 (9-11) (2006)
Chuanzhao Yu, Enjun Xiao, J. S. Yuan
Voltage stress-induced hot carrier effects on SiGe HBT VCO. Microelectron. Reliab. 45 (9-11) (2005)
J. S. Yuan, Li Yang
Teaching digital noise and noise margin issues in engineering education. IEEE Trans. Educ. 48 (1) (2005)
Anwar Sadat, Hongwei Qu, Chuanzhao Yu, J. S. Yuan, Huikai Xie
Low-power CMOS wireless MEMS motion sensor for physiological activity monitoring. IEEE Trans. Circuits Syst. I Regul. Pap. (12) (2005)
Chuanzhao Yu, J. S. Yuan, Anwar Sadat
Dynamic stress-induced high-frequency noise degradations in nMOSFETs. Microelectron. Reliab. 45 (9-11) (2005)
Enjun Xiao, P. P. Ghosh, Chuanzhao Yu, J. S. Yuan
Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications. Microelectron. Reliab. 45 (9-11) (2005)
Chuanzhao Yu, Hong Yang, Enjun Xiao, J. S. Yuan
Voltage stress-induced performance degradation in NMOSFET mixer. IEICE Electron. Express 2 (5) (2005)
Li Yang, J. S. Yuan
Design of enhancement current-balanced logic for mixed-signal ICs. ISCAS (1) (2003)
W. Kuang, J. S. Yuan
An Adaptive Supply-Voltage Scheme for Low Power Self-Timed CMOS Digital Design. VLSI Design (2003)
Li Yang, J. S. Yuan
A decoupling technique for CMOS strong-coupled structures. ACM Great Lakes Symposium on VLSI (2003)
W. Kuang, J. S. Yuan, Abdel Ejnioui
Supply Voltage Scalable System Design Using Self-Timed Circuits. ISVLSI (2003)
Li Yang, J. S. Yuan
Enhanced Techniques for Current Balanced Logic in Mixed-Signal ICs. ISVLSI (2003)
Li Yang, J. S. Yuan
Analyzing Internal-Switching Induced Simultaneous Switching Noise. ISQED (2003)
Li Yang, J. S. Yuan, M. Hagedorn
Modeling the output waveform of CMOS gate with feedback effect. ICECS (2002)
Wei Li, Qiang Li, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates
Hot-carrier-Induced Circuit Degradation for 0.18 µm CMOS Technology. ISQED (2001)
J. Song, J. S. Yuan, F. Schwierz, D. Schipanski
Effects of Ge profiles on base transit time and base resistance of SiGe HBT's. ICECS (1996)
Y. Dai, J. S. Yuan, A. M. Phanse, C. S. Yeh, K. Kwang
Scalable bipolar model for BiCMOS and bipolar circuits. ICECS (1996)
J. S. Yuan
Closed-loop manipulator control using quaternion feedback. IEEE J. Robotics Autom. 4 (4) (1988)