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RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments.
H. D. Yen
J. S. Yuan
R. L. Wang
G. W. Huang
W. K. Yeh
F. S. Huang
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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radio frequency
high speed
reliability analysis
analog vlsi
decision trees
low cost
real world
multiscale
power consumption
low power
low voltage