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H. D. Yen
Publication Activity (10 Years)
Years Active: 2012-2012
Publications (10 Years): 0
Top Topics
Multiscale
Reliability Analysis
Low Voltage
Analog Vlsi
Top Venues
Microelectron. Reliab.
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Publications
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H. D. Yen
,
J. S. Yuan
,
R. L. Wang
,
G. W. Huang
,
W. K. Yeh
,
F. S. Huang
RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments.
Microelectron. Reliab.
52 (11) (2012)