Dynamic stress-induced high-frequency noise degradations in nMOSFETs.
Chuanzhao YuJ. S. YuanAnwar SadatPublished in: Microelectron. Reliab. (2005)
Keyphrases
- high frequency
- low frequency
- high frequencies
- visual quality
- high resolution
- wavelet transform
- subband
- discrete wavelet transform
- low pass
- high frequency components
- wavelet coefficients
- wavelet domain
- low bit rate coding
- high pass
- frequency band
- wavelet decomposition
- image processing
- frequency domain
- random noise
- multiresolution
- computational complexity
- phase shifting
- multiscale
- high quality