Voltage stress-induced hot carrier effects on SiGe HBT VCO.

Chuanzhao Yu Enjun Xiao J. S. Yuan

Published in: Microelectron. Reliab. (2005)

Keyphrases

power system
real time
image processing
field effect transistors
high voltage
neural network
website
video sequences
evolutionary algorithm
computational intelligence
steady state
dual channel