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Hot-carrier-Induced Circuit Degradation for 0.18 µm CMOS Technology.
Wei Li
Qiang Li
J. S. Yuan
Joshua McConkey
Yuan Chen
Sundar Chetlur
Jonathan Zhou
A. S. Oates
Published in:
ISQED (2001)
Keyphrases
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cmos technology
low power
low voltage
power consumption
spl times
parallel processing
power dissipation
image sensor
low cost
mixed signal
high speed
digital images
flip flops