Glenn H. Chapman

Publication Activity (10 Years)

Years Active: 1988-2023
Publications (10 Years): 16

Top Topics

Image Degradation

Experimental Study

Spatial Interpolation

Top Venues

Sensors, Cameras, and Systems for Industrial and Scientific Applications

Publications

Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren
Image Degradation in Time Due to Interacting Hot Pixels. DFT (2023)
Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
Image Degradation due to Interacting Adjacent Hot Pixels. DFT (2022)
Vijay K. Jain, Glenn H. Chapman
Fault Tolerance for Islandable-Microgrid Sensors. DFT (2021)
Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren, Coelho Silva Meneses
Dependence of SEUs in Digital Cameras on Pixel size and Elevation. DFT (2021)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren
Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation. DFT (2020)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren
Detecting SEUs in Noisy Digital Imagers with small pixels. DFT (2019)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
Image degradation from hot pixel defects with pixel size shrinkage. IMSE (2019)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren
Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels. IMSE (2018)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels. DFT (2018)
Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren
Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. DFT (2017)
Glenn H. Chapman, Rahul Thomas, Israel Koren, Zahava Koren
Hot Pixel Behavior as Pixel Size Reduces to 1 micron. IMSE (2017)
David Stevens, Bonnie L. Gray, David Yin, Glenn H. Chapman, Daniel B. Leznoff
Post arrays for the immobilization of vapochromic coordination polymers for chemical sensors. IEEE SENSORS (2017)
Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren
Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes. IMSE (2016)
Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren
Experimental study and analysis of soft and permanent errors in digital cameras. DFT (2016)
Glenn H. Chapman, Rahul Thomas, Rohit Thomas, Zahava Koren, Israel Koren
Enhanced correction methods for high density hot pixel defects in digital imagers. IMSE (2015)
Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren
Single Event Upsets and Hot Pixels in digital imagers. DFTS (2015)
Glenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren
Improved correction for hot pixels in digital imagers. DFT (2014)
Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren
Correcting high-density hot pixel defects in digital imagers. IMSE (2014)
Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren
Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications (2013)
Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren
Improved image accuracy in Hot Pixel degraded digital cameras. DFTS (2013)
Glenn H. Chapman, Israel Koren, Zahava Koren
Do more camera pixels result in a better picture? IOLTS (2012)
Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren
Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications (2012)
Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren
Relating digital imager defect rates to pixel size, sensor area and ISO. DFT (2012)
Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren
Predicting Pixel Defect Rates Based on Image Sensor Parameters. DFT (2011)
Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren
Tradeoffs in imager design parameters for sensor reliability. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications (2011)
Glenn H. Chapman, Bonnie L. Gray, Vijay K. Jain
Creating Defect Tolerance in Microfluidic Capacitive/Photonic Biosensors. DFT (2011)
Phanindra Kalyanam, Glenn H. Chapman, M. Parameswaran
Simulating enhanced photo carrier collection in the multifinger photogate active pixel sensors. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications (2011)
Vijay K. Jain, Glenn H. Chapman
Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid. DFT (2011)
Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren
Tradeoffs in Imager Design with Respect to Pixel Defect Rates. DFT (2010)
Vijay K. Jain, Glenn H. Chapman
Massively Deployable Intelligent Sensors for the Smart Power Grid. DFT (2010)
Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren
Statistical identification and analysis of defect development in digital imagers. Digital Photography (2009)
Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren
Characterization of Gain Enhanced In-Field Defects in Digital Imagers. DFT (2009)
Glenn H. Chapman, Vijay K. Jain
Defect Tolerance for a Capacitance Based Nanoscale Biosensor. DFT (2008)
Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren
Automatic Detection of In-field eld Defect Growth in Image Sensors. DFT (2008)
James Dykes, Paulman Chan, Glenn H. Chapman, Lesley Shannon
A Multiprocessor System-on-Chip Implementation of a Laser-based Transparency Meter on an FPGA. FPT (2007)
Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Glenn H. Chapman
A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects. DFT (2007)
Jozsef Dudas, Linda Wu, Cory Jung, Glenn H. Chapman, Zahava Koren, Israel Koren
Identification of in-field defect development in digital image sensors. Digital Photography (2007)
Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren
Quantitative Analysis of In-Field Defects in Image Sensor Arrays. DFT (2007)
Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren
On-Line Mapping of In-Field Defects in Image Sensor Arrays. DFT (2006)
Vijay K. Jain, Glenn H. Chapman
Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC. DFT (2006)
Michelle L. La Haye, Cory Jung, David Chen, Glenn H. Chapman, Jozsef Dudas
Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies. DFT (2006)
Fartash Vasefi, Paulman K. Y. Chan, Bozena Kaminska, Glenn H. Chapman
Subsurface Bioimaging using Angular Domain Optical Backscattering Illumination. EMBC (2006)
Vijay K. Jain, Sanjukta Bhanja, Glenn H. Chapman, Lavanya Doddannagari, Nguyen Nguyen
A parallel architecture for the ICA algorithm: DSP plane of a 3-D heterogeneous sensor. ICASSP (5) (2005)
Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
Inter-Plane Via Defect Detection Using the Sensor Plane in 3-D Heterogeneous Sensor Systems. DFT (2005)
Vijay K. Jain, Sanjukta Bhanja, Glenn H. Chapman, Lavanya Doddannagari
A highly reconfigurable computing array: DSP plane of a 3D heterogeneous SoC. SoCC (2005)
Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung
On-Line Identification of Faults in Fault-Tolerant Imagers. DFT (2005)
Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren
A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Des. Test Comput. 21 (6) (2004)
Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
Defect Avoidance in a 3-D Heterogeneous Sensor. DFT (2004)
Michelle L. La Haye, Glenn H. Chapman, Cory Jung, Desmond Y. H. Cheung, Sunjaya Djaja, Benjamin Wang, Gary Liaw, Yves Audet
Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS). DFT (2004)
Vijay K. Jain, Glenn H. Chapman
Level-Hybrid Optoelectronic TESH Interconnection Network. DFT (2003)
Régis Leveugle, Glenn H. Chapman
Special section on defect and fault tolerance in VLSI systems. Microelectron. J. 34 (1) (2003)
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Cheung, Yves Audet
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS). DFT (2003)
Yves Audet, Glenn H. Chapman
Design of a Self-Correcting Active Pixel Sensor. DFT (2001)
Israel Koren, Zahava Koren, Glenn H. Chapman
Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. DFT (2001)
Israel Koren, Zahava Koren, Glenn H. Chapman
A Self-Correcting Active Pixel Camera. DFT (2000)
Glenn H. Chapman, Yves Audet
Creating 35 mm Camera Active Pixel Sensors. DFT (1999)
Glenn H. Chapman
FPGA Design for Decimeter Scale Integration (DMSI). DFT (1998)
Glenn H. Chapman, Benoit Dufort
Using Laser Defect Avoidance to Build Large-Area FPGAs. IEEE Des. Test Comput. 15 (4) (1998)
Glenn H. Chapman, Benoit Dufort
Laser Correcting Defects to Create Transparent Routing for Large Area FPGA's. FPGA (1997)
Yves Audet, Glenn H. Chapman
Yield improvement of a large area magnetic field sensor array using redundancy schemes. IEEE Trans. Very Large Scale Integr. Syst. 5 (1) (1997)
Glenn H. Chapman, Benoit Dufort
Laser defect correction applications to FPGA based custom computers. FCCM (1997)
Stuart K. Tewksbury, Glenn H. Chapman
Guest Editorial Foreword to the Special Section on WSI'95. IEEE Trans. Very Large Scale Integr. Syst. 5 (1) (1997)
Glenn H. Chapman, Benoit Dufort
Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays. DFT (1996)
Glenn H. Chapman, D. E. Bergen, K. Fang
Wafer-scale integration defect avoidance tradeoffs between laser links and Omega network switching. DFT (1995)
Glenn H. Chapman
Laser Processes for Defect Correction in Large Area VLSI Systems. DFT (1994)
Glenn H. Chapman, M. Parameswaran, Marek Syrzycki
Wafer-Scale Transducer Arrays. Computer 25 (4) (1992)
F. Matthew Rhodes, Joseph J. Dituri, Glenn H. Chapman, Bruce E. Emerson, Antonio M. Soares, Jack I. Raffel
A Monolithic Hough Transform Processor Based on Restructurable VLSI. IEEE Trans. Pattern Anal. Mach. Intell. 10 (1) (1988)