Zahava Koren

Publication Activity (10 Years)

Years Active: 1986-2023
Publications (10 Years): 12

Top Topics

Image Degradation

Experimental Study

Top Venues

Int. J. Embed. Syst.

Publications

Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren
Image Degradation in Time Due to Interacting Hot Pixels. DFT (2023)
Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
Image Degradation due to Interacting Adjacent Hot Pixels. DFT (2022)
Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren, Coelho Silva Meneses
Dependence of SEUs in Digital Cameras on Pixel size and Elevation. DFT (2021)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren
Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation. DFT (2020)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren
Detecting SEUs in Noisy Digital Imagers with small pixels. DFT (2019)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
Image degradation from hot pixel defects with pixel size shrinkage. IMSE (2019)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren
Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels. IMSE (2018)
Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels. DFT (2018)
Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren
Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. DFT (2017)
Glenn H. Chapman, Rahul Thomas, Israel Koren, Zahava Koren
Hot Pixel Behavior as Pixel Size Reduces to 1 micron. IMSE (2017)
Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren
Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes. IMSE (2016)
Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren
Experimental study and analysis of soft and permanent errors in digital cameras. DFT (2016)
Glenn H. Chapman, Rahul Thomas, Rohit Thomas, Zahava Koren, Israel Koren
Enhanced correction methods for high density hot pixel defects in digital imagers. IMSE (2015)
Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren
Single Event Upsets and Hot Pixels in digital imagers. DFTS (2015)
Glenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren
Improved correction for hot pixels in digital imagers. DFT (2014)
Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren
Correcting high-density hot pixel defects in digital imagers. IMSE (2014)
R. C. Ravindran, C. Mani Krishna, Israel Koren, Zahava Koren
Scheduling imprecise task graphs for real-time applications. Int. J. Embed. Syst. 6 (1) (2014)
Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren
Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications (2013)
Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren
Improved image accuracy in Hot Pixel degraded digital cameras. DFTS (2013)
Glenn H. Chapman, Israel Koren, Zahava Koren
Do more camera pixels result in a better picture? IOLTS (2012)
Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren
Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications (2012)
Abhinna Jain, C. M. Krishna, Israel Koren, Zahava Koren
Cost Functions for Scheduling Tasks in Cyber-physical Systems. ICINCO (1) (2012)
Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren
Relating digital imager defect rates to pixel size, sensor area and ISO. DFT (2012)
Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren
Predicting Pixel Defect Rates Based on Image Sensor Parameters. DFT (2011)
Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren
Tradeoffs in imager design parameters for sensor reliability. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications (2011)
Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren
Tradeoffs in Imager Design with Respect to Pixel Defect Rates. DFT (2010)
Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren
Statistical identification and analysis of defect development in digital imagers. Digital Photography (2009)
Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren
Characterization of Gain Enhanced In-Field Defects in Digital Imagers. DFT (2009)
Srikanth Sundaresan, Israel Koren, Zahava Koren, C. Mani Krishna
Event-driven adaptive duty-cycling in sensor networks. Int. J. Sens. Networks 6 (2) (2009)
Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren
Automatic Detection of In-field eld Defect Growth in Image Sensors. DFT (2008)
Jozsef Dudas, Linda Wu, Cory Jung, Glenn H. Chapman, Zahava Koren, Israel Koren
Identification of in-field defect development in digital image sensors. Digital Photography (2007)
Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren
Quantitative Analysis of In-Field Defects in Image Sensor Arrays. DFT (2007)
Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren
On-Line Mapping of In-Field Defects in Image Sensor Arrays. DFT (2006)
Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung
On-Line Identification of Faults in Fault-Tolerant Imagers. DFT (2005)
Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren
A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Des. Test Comput. 21 (6) (2004)
E. Ciocca, Israel Koren, Zahava Koren, C. Mani Krishna, Daniel S. Katz
Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer. PRDC (2004)
Jayakrishnan Nair, Zahava Koren, Israel Koren, C. Mani Krishna
Pre-Processing Input Data to Augment Fault Tolerance in Space Applications. DSN (2003)
Zahava Koren, J. Rajagopal, C. Mani Krishna, Israel Koren, W. Wang, J. Loman
Using Rational Approximations for Evaluating the Reliablity of Highly Reliable Systems. IPDPS (2002)
Israel Koren, Zahava Koren, Glenn H. Chapman
Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. DFT (2001)
Vijay Lakamraju, Zahava Koren, C. Mani Krishna
Synthesis of Interconnection Networks: A Novel Approach. DSN (2000)
Israel Koren, Zahava Koren
Incorporating Yield Enhancement into the Floorplanning Process. IEEE Trans. Computers 49 (6) (2000)
Israel Koren, Zahava Koren, Glenn H. Chapman
A Self-Correcting Active Pixel Camera. DFT (2000)
Israel Koren, Zahava Koren
Defect tolerance in VLSI circuits: techniques and yield analysis. Proc. IEEE 86 (9) (1998)
Vijay Lakamraju, Zahava Koren, Israel Koren, C. Mani Krishna
Measuring the Vulnerability of Interconnection Networks in Embedded Systems. IPPS/SPDP Workshops (1998)
Zahava Koren, Israel Koren, C. Mani Krishna
Surge Handling as a Measure of Real-Time System Dependability. IPPS/SPDP Workshops (1998)
Israel Koren, Zahava Koren
Yield and Routing Objectives in Floorplanning. DFT (1998)
Israel Koren, Zahava Koren
Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs. DFT (1997)
Zahava Koren, Israel Koren
On the effect of floorplanning on the yield of large area integrated circuits. IEEE Trans. Very Large Scale Integr. Syst. 5 (1) (1997)
Régis Leveugle, Zahava Koren, Israel Koren, Gabriele Saucier, Norbert Wehn
The Hyeti Defect Tolerant Microprocessor: A Practical Experiment and its Cost-Effectiveness Analysis. IEEE Trans. Computers 43 (12) (1994)
Israel Koren, Zahava Koren, Charles H. Stapper
A statistical study of defect maps of large area VLSI IC's. IEEE Trans. Very Large Scale Integr. Syst. 2 (2) (1994)
Zahava Koren, Israel Koren
Does the Floorplan of a Chip Affect Its Yield? DFT (1993)
Israel Koren, Zahava Koren, Charles H. Stapper
A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits. IEEE Trans. Computers 42 (6) (1993)
Aura Ganz, Zahava Koren
WDM Passive Star-Protocols and Performance Analysis. INFOCOM (1991)
Israel Koren, Zahava Koren
Discrete and Continuous Models for the Performance of Reconfigurable Multistage Systems. IEEE Trans. Computers 40 (9) (1991)
Imrich Chlamtac, Aura Ganz, Zahava Koren
Prioritized demand assignment protocols and their evaluation. IEEE Trans. Commun. 36 (2) (1988)
Israel Koren, Zahava Koren
On the Bandwidth of a Multi-Stage Network in the Presence of Faulty Components. ICDCS (1988)
Israel Koren, Zahava Koren, Stephen Y. H. Su
Analysis of a Class of Recovery Procedures. IEEE Trans. Computers 35 (8) (1986)
Zahava Koren, Imrich Chlamtac, Aura Ganz
A model for evaluating demand assignment protocols with arbitrary workloads. SIGCOMM (1986)