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A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits.
Israel Koren
Zahava Koren
Charles H. Stapper
Published in:
IEEE Trans. Computers (1993)
Keyphrases
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data analysis
computer vision
positive and negative
real world
data sets
decision making
image processing
multi agent systems
statistical analysis
quantitative analysis
defect detection