Defect Tolerance for a Capacitance Based Nanoscale Biosensor.

Glenn H. Chapman Vijay K. Jain

Published in: DFT (2008)

Keyphrases

high speed
defect detection
unit length
atomic force microscopy
transmission line
high frequency
image sequences
mechanical properties
low power
computational intelligence
real time
feature vectors
pairwise
multi agent systems
pattern recognition
optimal solution
high quality
decision making