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Yield improvement of a large area magnetic field sensor array using redundancy schemes.

Yves AudetGlenn H. Chapman
Published in: IEEE Trans. Very Large Scale Integr. Syst. (1997)
Keyphrases
  • magnetic field
  • sensor array
  • eddy current
  • electromagnetic fields
  • line fitting
  • resonant frequency
  • multiresolution
  • feature selection
  • model selection