LINE FITTING
Experts
- Josef Kittler
- Arye Nehorai
- Mark B. Sandler
- Hiroyasu Koshimizu
- Nahum Kiryati
- John Illingworth
- Corrado Di Natale
- Isaac Weiss
- Mauro Carlo Beltrametti
- Amine Bermak
- Zhanyi Hu
- Dmitry P. Nikolaev
- Roberto Paolesse
- Anna Maria Massone
- Alexandro Catini
- Alfred M. Bruckstein
- Mark S. Nixon
- Mohammed Atiquzzaman
- Kazuhito Murakami
- Azriel Rosenfeld
- Phil L. Palmer
- Nikos Papamarkos
- John N. Carter
- Chong Meng Samson See
- Shiu Yin Yuen
- Maria Petrou
- Emilio L. Zapata
- Munetoshi Numada
- Aparecido Nilceu Marana
- Raymond K. K. Yip
- Alex B. Gershman
- Nicolás Guil
- Luciano da Fontoura Costa
- Taylan O. Gulum
- Songde Ma
- Atsushi Imiya
- Wayne Niblack
- Weidong Wang
- Ravi Kumar Satzoda
Venues
- Sensors
- Pattern Recognit. Lett.
- ICASSP
- Pattern Recognit.
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- IEEE Trans. Signal Process.
- IEEE Trans. Instrum. Meas.
- ISCAS
- ICPR
- Image Vis. Comput.
- Signal Process.
- EUSIPCO
- IEEE SENSORS
- SAM
- ICIP
- MVA
- ICASSP (4)
- Comput. Vis. Image Underst.
- BioCAS
- EMBC
- ROBIO
- BMVC
- IROS
- IEEE Trans. Image Process.
- ICPR (2)
- IEEE Trans. Biomed. Circuits Syst.
- I2MTC
- ISOEN
- Real Time Imaging
- SIU
- Systems and Computers in Japan
- Digit. Signal Process.
- IEEE Signal Process. Lett.
- J. Sensors
- EURASIP J. Adv. Signal Process.
- Mach. Vis. Appl.
- NEMS
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