Bertrand Boudart

Publication Activity (10 Years)

Years Active: 2003-2015
Publications (10 Years): 1

Top Topics

Levenberg Marquardt

Electrical Properties

Selection Algorithm

Quantitative Analysis

Top Venues

Microelectron. Reliab.

Publications

Sébastien Petitdidier, Fanny Berthet, Yannick Guhel, Jean-Lionel Trolet, Philippe Mary, Christophe Gaquière, Bertrand Boudart
Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs. Microelectron. Reliab. 55 (9-10) (2015)
Amrane Oukaour, Mathieu Pouliquen, Boubekeur Tala-Ighil, Hamid Gualous, Eric Pigeon, Olivier Gehan, Bertrand Boudart
Supercapacitors aging diagnosis using least square algorithm. Microelectron. Reliab. 53 (9-11) (2013)
Fanny Berthet, Yannick Guhel, Hamid Gualous, Bertrand Boudart, Jean-Lionel Trolet, Marc Piccione, Christophe Gaquière
Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence. Microelectron. Reliab. 52 (9-10) (2012)
Hamid Gualous, Roland Gallay, Monzer Al Sakka, Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Boudart
Calendar and cycling ageing of activated carbon supercapacitor for automotive application. Microelectron. Reliab. 52 (9-10) (2012)
Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Pouderoux, M. Tounsi, M. Bouarroudj-Berkani, Stéphane Lefebvre, Bertrand Boudart
Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. Microelectron. Reliab. 51 (2) (2011)
Boubekeur Tala-Ighil, Amrane Oukaour, Hamid Gualous, Bertrand Boudart, Bertrand Pouderoux, Jean-Lionel Trolet, Marc Piccione
Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour. Microelectron. Reliab. 51 (9-11) (2011)
F. Berthet, Y. Guhel, Hamid Gualous, Bertrand Boudart, Jean-Lionel Trolet, Marc Piccione, Christophe Gaquière
Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy. Microelectron. Reliab. 51 (9-11) (2011)
Hamid Gualous, Roland Gallay, G. Alcicek, Boubekeur Tala-Ighil, Amrane Oukaour, Bertrand Boudart, Ph. Makany
Supercapacitor ageing at constant temperature and constant voltage and thermal shock. Microelectron. Reliab. 50 (9-11) (2010)
M. Tounsi, Amrane Oukaour, Boubekeur Tala-Ighil, Hamid Gualous, Bertrand Boudart, Djamil Aïssani
Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. Microelectron. Reliab. 50 (9-11) (2010)
Y. Guhel, Bertrand Boudart, E. Delos, Marianne Germain, Z. Bougrioua
N. Microelectron. Reliab. 46 (5-6) (2006)
Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart
Trench insulated gate bipolar transistors submitted to high temperature bias stress. Microelectron. Reliab. 45 (9-11) (2005)
Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart
Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress. Microelectron. Reliab. 44 (9-11) (2004)
Fabiana Rampazzo, Roberto Pierobon, D. Pacetta, Christophe Gaquière, Didier Théron, Bertrand Boudart, Gaudenzio Meneghesso, Enrico Zanoni
Hot carrier aging degradation phenomena in GaN based MESFETs. Microelectron. Reliab. 44 (9-11) (2004)
Hamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, Bertrand Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. Microelectron. Reliab. 43 (9-11) (2003)