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Hot carrier aging degradation phenomena in GaN based MESFETs.

Fabiana RampazzoRoberto PierobonD. PacettaChristophe GaquièreDidier ThéronBertrand BoudartGaudenzio MeneghessoEnrico Zanoni
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • structuring elements
  • age related
  • database
  • data sets
  • data mining
  • artificial intelligence
  • multimedia
  • database systems
  • relational databases
  • gray level
  • complex systems
  • image degradation
  • natural phenomena