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Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence.

Fanny BerthetYannick GuhelHamid GualousBertrand BoudartJean-Lionel TroletMarc PiccioneChristophe Gaquière
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • infrared
  • electrical properties
  • x ray
  • transmission line
  • positive effects
  • visible spectrum
  • electrical power
  • e learning
  • gray scale
  • structuring elements