Boubekeur Tala-Ighil

Publication Activity (10 Years)

Years Active: 2001-2015
Publications (10 Years): 1

Top Topics

Levenberg Marquardt

Comparative Study

Expectation Maximization

Selection Algorithm

Top Venues

Microelectron. Reliab.

Publications

Boubekeur Tala-Ighil, Jean-Lionel Trolet, Hamid Gualous, P. Mary, Stéphane Lefebvre
Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET. Microelectron. Reliab. 55 (9-10) (2015)
Amrane Oukaour, Mathieu Pouliquen, Boubekeur Tala-Ighil, Hamid Gualous, Eric Pigeon, Olivier Gehan, Bertrand Boudart
Supercapacitors aging diagnosis using least square algorithm. Microelectron. Reliab. 53 (9-11) (2013)
Hamid Gualous, Roland Gallay, Monzer Al Sakka, Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Boudart
Calendar and cycling ageing of activated carbon supercapacitor for automotive application. Microelectron. Reliab. 52 (9-10) (2012)
Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Pouderoux, M. Tounsi, M. Bouarroudj-Berkani, Stéphane Lefebvre, Bertrand Boudart
Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. Microelectron. Reliab. 51 (2) (2011)
Boubekeur Tala-Ighil, Amrane Oukaour, Hamid Gualous, Bertrand Boudart, Bertrand Pouderoux, Jean-Lionel Trolet, Marc Piccione
Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour. Microelectron. Reliab. 51 (9-11) (2011)
Hamid Gualous, Roland Gallay, G. Alcicek, Boubekeur Tala-Ighil, Amrane Oukaour, Bertrand Boudart, Ph. Makany
Supercapacitor ageing at constant temperature and constant voltage and thermal shock. Microelectron. Reliab. 50 (9-11) (2010)
M. Tounsi, Amrane Oukaour, Boubekeur Tala-Ighil, Hamid Gualous, Bertrand Boudart, Djamil Aïssani
Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. Microelectron. Reliab. 50 (9-11) (2010)
Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart
Trench insulated gate bipolar transistors submitted to high temperature bias stress. Microelectron. Reliab. 45 (9-11) (2005)
Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart
Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress. Microelectron. Reliab. 44 (9-11) (2004)
Hamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, Bertrand Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. Microelectron. Reliab. 43 (9-11) (2003)
Hamid Toutah, Jean-François Llibre, Boubekeur Tala-Ighil, Taieb Mohammed-Brahim, Youri Helen, G. Gautier, Olivier Bonnaud
Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating. Microelectron. Reliab. 41 (9-10) (2001)