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Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature.

M. TounsiAmrane OukaourBoubekeur Tala-IghilHamid GualousBertrand BoudartDjamil Aïssani
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • high voltage
  • power consumption
  • operating conditions
  • duty cycle
  • image quality
  • normal operation
  • decision making
  • test data
  • matlab simulink
  • partial discharge
  • real time
  • data sets
  • learning algorithm
  • ambient intelligence