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Degradation in polysilicon thin film transistors related to the quality of the polysilicon material.

Hamid ToutahBoubekeur Tala-IghilJean-François LlibreBertrand BoudartTaieb Mohammed-BrahimOlivier Bonnaud
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • random access memory
  • thin film
  • high density
  • design considerations
  • low voltage
  • short circuit
  • multi layer
  • database systems
  • low power
  • cmos technology
  • databases
  • data analysis
  • artificial neural networks
  • solar cell