FLIGHT TEST
Experts
- Paul M. J. Van den Hof
- Enmin Feng
- Guy Albert Dumont
- Rogelio Lozano
- Ian Postlethwaite
- Mo-Yuen Chow
- Habiballah Rahimi-Eichi
- Liang Yin
- Michel Verhaegen
- Olympia Roeva
- Zhilong Xiu
- Raquel Urtasun
- Xiaowei Liu
- Weiping Chen
- Malgorzata Charytanowicz
- John Lygeros
- Eric Feron
- Guanbin Gao
- H. Jin Kim
- Peter I. Corke
- Mykel J. Kochenderfer
- Haibin Duan
- Chao-Chung Peng
- Andreas Rauh
- Kostas Alexis
- Christos Papachristos
- Andrea Cristofaro
- Félix Mora-Camino
- Eduardo Steed Espinoza
- Jin Tian
- John Mark Ansermino
- Masayoshi Tomizuka
- Yasuyuki Funahashi
- Riccardo Lanari
- Piotr Kulczycki
- Jingkang Wang
- Sivabalan Manivasagam
- Lincheng Shen
- S. N. Omkar
Venues
- CoRR
- CDC
- ACC
- Autom.
- Sensors
- ICRA
- IEEE Access
- IEEE Trans. Ind. Electron.
- ECC
- IECON
- IROS
- IGARSS
- IEEE Trans. Control. Syst. Technol.
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Autom. Control.
- ISCAS
- Appl. Soft Comput.
- Remote. Sens.
- J. Aerosp. Inf. Syst.
- IEEE Trans. Biomed. Eng.
- EMBC
- J. Frankl. Inst.
- Int. J. Model. Identif. Control.
- J. Intell. Robotic Syst.
- CCTA
- CDC/ECC
- Appl. Math. Comput.
- MED
- IEEE Trans. Intell. Transp. Syst.
- Biomed. Signal Process. Control.
- NER
- ROBIO
- Comput. Chem. Eng.
- ITSC
- PIMRC
- ICCA
- IEEE Robotics Autom. Lett.
- SMC
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