FLIGHT TEST
Experts
- Paul M. J. Van den Hof
- Enmin Feng
- Guy Albert Dumont
- Rogelio Lozano
- Ian Postlethwaite
- Olympia Roeva
- Zhilong Xiu
- Mo-Yuen Chow
- Raquel Urtasun
- Xiaowei Liu
- Habiballah Rahimi-Eichi
- Michel Verhaegen
- Liang Yin
- Kostas Alexis
- Paolo Berardino
- Rodrigo Ventura
- Marco Lovera
- John Lygeros
- Maria Angelova
- Federico Baronti
- Chao-Chung Peng
- Jingkang Wang
- Fred Y. Hadaegh
- Xiyuan Peng
- H. Jin Kim
- Datong Liu
- Riccardo Lanari
- Håkan Hjalmarsson
- Jan-Willem van Wingerden
- Eduardo Steed Espinoza
- Masayoshi Tomizuka
- Christos Papachristos
- Yuwen Xiong
- Yasuyuki Funahashi
- Mahsa Shoaran
- Eric Feron
- Hossam S. Abbas
- Hicham Chaoui
- Andreas Rauh
Venues
- CoRR
- CDC
- ACC
- Autom.
- Sensors
- ICRA
- IEEE Trans. Ind. Electron.
- IEEE Access
- ECC
- IROS
- IECON
- IGARSS
- IEEE Trans. Control. Syst. Technol.
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Autom. Control.
- ISCAS
- Appl. Soft Comput.
- Remote. Sens.
- J. Aerosp. Inf. Syst.
- IEEE Trans. Biomed. Eng.
- J. Frankl. Inst.
- CCTA
- EMBC
- Int. J. Model. Identif. Control.
- J. Intell. Robotic Syst.
- Appl. Math. Comput.
- NER
- MED
- IEEE Trans. Intell. Transp. Syst.
- Biomed. Signal Process. Control.
- CDC/ECC
- PIMRC
- SMC
- ITSC
- Comput. Chem. Eng.
- ROBIO
- IEEE Robotics Autom. Lett.
- ICCA
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