On the Susceptibility of QDI Circuits to Transient Faults.
Raghda El ShehabyMatthias FüggerAndreas SteiningerPublished in: FORMATS (2023)
Keyphrases
- built in self test
- fault models
- fault diagnosis
- steady state
- analog circuits
- fault detection
- model based diagnosis
- fault model
- high speed
- logic synthesis
- fault detection and diagnosis
- circuit design
- digital circuits
- data sets
- integrated circuit
- delay insensitive
- quantum computing
- fault detection and isolation
- vlsi circuits
- analog vlsi
- test cases
- artificial intelligence
- decision making
- expert systems
- data mining
- low cost
- root cause
- databases
- database
- lateral inhibition
- tunnel diode