Using Platform FPGAs for Fault Emulation and Test-set Generation to Detect Stuck-at Faults.
Carson DunbarKundan NepalPublished in: J. Comput. (2011)
Keyphrases
- test set
- fault diagnosis
- fault detection
- error rate
- multiple faults
- test cases
- fault model
- training set
- fault detection and isolation
- test data
- training data
- neural network
- expert systems
- evaluation methodology
- detection algorithm
- class distribution
- field programmable gate array
- detection method
- fault isolation
- face detection
- hardware implementation
- complex background
- feature vectors
- reconfigurable hardware
- database
- training and test sets