Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons.
S. YuBarrie W. JervisKevin R. EckersallIan M. BellPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1997)
Keyphrases
- multilayer perceptron
- fault diagnosis
- neural network
- model based diagnosis
- fault detection
- multiple faults
- leakage current
- low voltage
- fault detection and diagnosis
- gate dielectrics
- electrical properties
- cmos technology
- silicon dioxide
- back propagation
- artificial neural networks
- field effect transistors
- hidden layer
- fault model
- radial basis function
- radial basis function network
- neural network model
- root cause
- high speed
- nm technology
- activation function
- low power
- power consumption
- neuro fuzzy models
- feedforward neural networks
- low cost
- metal oxide semiconductor
- fault models
- repair actions
- rbf neural network
- search space
- decision making
- feed forward
- pattern recognition
- expert systems
- control system
- knn
- fuzzy logic
- commonly applied
- steady state
- belief networks