Ian M. Bell

Publication Activity (10 Years)

Years Active: 1995-2013
Publications (10 Years): 0

Top Topics

Video Sequences

Modeling Method

Top Venues

J. Electron. Test.

Publications

Likun Xia, Muhammad Umer Farooq, Ian M. Bell, Fawnizu Azmadi Hussin, Aamir Saeed Malik
Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling. J. Electron. Test. 29 (6) (2013)
Thomas O. Myers, Ian M. Bell
Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics. J. Electron. Test. 27 (3) (2011)
Likun Xia, Ian M. Bell, Antony J. Wilkinson
Automated Model Generation Algorithm for High-Level Fault Modeling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (7) (2010)
Likun Xia, Ian M. Bell, Antony J. Wilkinson
A novel approach for automated model generation. ISCAS (2008)
Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope
High Level Modelling and Design For a Microthreaded Scheduler to Support Microgrids. AICCSA (2007)
Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope
Asynchronous arbiter for micro-threaded chip multiprocessors. J. Syst. Archit. 53 (5-6) (2007)
J. M. Gilbert, Ian M. Bell
The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach. J. Electron. Test. 23 (4) (2007)
Nabil Hasasneh, Ian M. Bell, Chris R. Jesshope
Scalable and Partitionable Asynchronous Arbiter for Micro-threaded Chip Multiprocessors. ARCS (2006)
Ian M. Bell, Nabil Hasasneh, Chris R. Jesshope
Supporting Microthread Scheduling and Synchronisation in CMPs. Int. J. Parallel Program. 34 (4) (2006)
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J. Electron. Test. 20 (1) (2004)
J. M. Gilbert, Ian M. Bell, D. R. Johnson
Design, Manufacture and Test - Quality Test Estimation. ISQED (2002)
Ian M. Bell, Stephen J. Spinks
Evaluation and comparison of structural test methodologies for analogue and mixed signal circuits. ICECS (1998)
S. Yu, Barrie W. Jervis, Kevin R. Eckersall, Ian M. Bell
Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16 (8) (1997)
Osama K. Abu-Shahla, Ian M. Bell
An On-Line Self-Testing Switched-Current Integrator. ITC (1997)
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. DFT (1997)
José Machado da Silva, José Silva Matos, Ian M. Bell, Gaynor E. Taylor
Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits. J. Electron. Test. 9 (1-2) (1996)
Ian M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor
Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. ISCAS (1995)
Geir E. Sæther, Chris Toumazou, Gaynor E. Taylor, Kevin R. Eckersall, Ian M. Bell
I-Technique. ISCAS (1995)