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Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations.

Stephen J. SpinksChris D. ChalkIan M. BellMark Zwolinski
Published in: J. Electron. Test. (2004)
Keyphrases
  • analog circuits
  • neural network
  • machine learning
  • generation process
  • model checking
  • process model
  • conceptual model
  • efficient implementation
  • digital circuits