Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths.
Nobuhiro YanagidaHiroshi TakahashiYuzo TakamatsuPublished in: Asian Test Symposium (1998)
Keyphrases
- fault diagnosis
- electron beam
- logic circuits
- low power
- x ray
- integrated circuit
- neural network
- fault detection
- expert systems
- design parameters
- monitoring and fault diagnosis
- fuzzy logic
- bp neural network
- chemical process
- electronic equipment
- fault detection and diagnosis
- power transformers
- shortest path
- gas turbine
- multiple faults
- semiconductor devices
- operating conditions
- condition monitoring
- analog circuits
- rotating machinery
- multi sensor information fusion
- rbf neural network
- power consumption
- tunnel diode
- low cost
- power dissipation
- real time
- image analysis
- user interface
- case study