Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation.
Tao WeiMike W. T. WongYim-Shu LeePublished in: Asian Test Symposium (1996)
Keyphrases
- fault diagnosis
- analog circuits
- neural network
- expert systems
- fault detection
- condition monitoring
- fuzzy logic
- fault detection and diagnosis
- operating conditions
- chemical process
- failure diagnosis
- data mining
- electronic equipment
- multiple faults
- digital circuits
- bp neural network
- power transformers
- fault detection and isolation
- high speed
- electrical power systems