Mike W. T. Wong

Publication Activity (10 Years)

Years Active: 1995-2004
Publications (10 Years): 0

Publications

Mike W. T. Wong, Yubin Zhang
Design and Implementation of Self-Testable Full Range Window Comparator. Asian Test Symposium (2004)
Mike W. T. Wong
Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis. Asian Test Symposium (2003)
Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee
Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis. DELTA (2002)
Mike W. T. Wong, K. Y. Ko, Yim-Shu Lee
Analog and Mixed-Signal IP Cores Testing. DELTA (2002)
K. Y. Ko, Mike W. T. Wong, Yim-Shu Lee
Testing System-On-Chip by Summations of Cores? Test Output Voltages. Asian Test Symposium (2002)
Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee
The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study. ETW (2001)
K. Y. Ko, Mike W. T. Wong
New built-in self-test technique based on addition/subtraction of selected node voltages. Asian Test Symposium (2000)
Matthew Worsman, Mike W. T. Wong
Non‐linear analog circuit fault diagnosis with large change sensitivity. Int. J. Circuit Theory Appl. 28 (3) (2000)
Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee
A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality. ISQED (2000)
Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee
Analog circuit equivalent faults in the D.C. domain. Asian Test Symposium (2000)
Mike W. T. Wong, Matthew Worsman
DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity. Asian Test Symposium (1998)
Matthew Worsman, Mike W. T. Wong
Nonlinear circuit fault diagnosis with large change sensitivity. ICECS (1998)
Yingquan Zhou, Mike W. T. Wong, Yinghua Min
On concurrent multiple error diagnosability in linear analog circuits using continuous checksum. Int. J. Circuit Theory Appl. 26 (1) (1998)
Joseph C. W. Pang, Mike W. T. Wong, Yim-Shu Lee
Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits. Asian Test Symposium (1997)
Tao Wei, Mike W. T. Wong, Yim-Shu Lee
Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation. Asian Test Symposium (1996)
Yingquan Zhou, Mike W. T. Wong, Yinghua Min
Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis. J. Electron. Test. 9 (1-2) (1996)
Yingquan Zhou, Mike W. T. Wong, Yinghua Min
Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers. FTCS (1995)