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Analog circuit equivalent faults in the D.C. domain.

Matthew WorsmanMike W. T. WongYim-Shu Lee
Published in: Asian Test Symposium (2000)
Keyphrases
  • analog circuits
  • fault diagnosis
  • domain specific
  • digital circuits
  • neural network
  • domain independent
  • fault detection
  • real time
  • relational databases
  • low cost