Testing System-On-Chip by Summations of Cores? Test Output Voltages.
K. Y. KoMike W. T. WongYim-Shu LeePublished in: Asian Test Symposium (2002)
Keyphrases
- test cases
- test generation
- software testing
- test sequences
- test suite
- test data
- statistical tests
- hardware and software
- integration testing
- test case generation
- code coverage
- input data
- test set
- embedded systems
- regression testing
- testing process
- neural network
- database
- number of test cases
- transmission line
- statistical significance
- power consumption
- expert systems
- training data