Uneven illumination surface defects inspection based on convolutional neural network.
Hao WuXiangrong XuWenbin GaoPublished in: CoRR (2019)
Keyphrases
- convolutional neural network
- surface inspection
- surface defects
- machine vision
- automated visual inspection
- quality control
- photometric stereo
- face detection
- lighting conditions
- printed circuit boards
- vision system
- illumination invariant
- specular reflection
- single image
- human faces
- imaging conditions
- illumination conditions
- light source
- varying illumination
- image processing
- color constancy
- manufacturing systems
- visual inspection
- neural network
- object detection
- partial occlusion
- software engineering
- training data
- feature extraction
- case study
- computer vision