IMAGING CONDITIONS
Experts
- Tien-Tsin Wong
- Paul E. Debevec
- Sven Loncaric
- Abhijeet Ghosh
- Nikola Banic
- Pieter Peers
- Reinhard Klette
- Brian V. Funt
- Katsushi Ikeuchi
- Chi-Sing Leung
- Qiang Ji
- Carsten Dachsbacher
- Yoichi Sato
- Shree K. Nayar
- Ramesh Raskar
- Philippe Bekaert
- Jorge Urrutia
- Thorsten Grosch
- Aly A. Farag
- Pheng-Ann Heng
- Jérôme Idier
- Jeff B. Pelz
- Donald P. Greenberg
- Graham D. Finlayson
- Marc Allain
- Anselm Grundhöfer
- Alexei A. Efros
- Theo Gevers
- Imari Sato
- Kavita Bala
- Tobias Ritschel
- Vijayan K. Asari
- Reiner Lenz
- Srinivasa G. Narasimhan
- Matthew A. Turk
- Jan Kautz
- Timo Ropinski
- Anne Sentenac
- Shuo Chen
Venues
- CoRR
- ICIP
- CVPR
- Sensors
- Comput. Graph. Forum
- IEEE Access
- Multim. Tools Appl.
- ICCV
- ICPR
- Color Imaging Conference
- IEEE Trans. Image Process.
- Pattern Recognit.
- Pattern Recognit. Lett.
- Rendering Techniques
- ACM Trans. Graph.
- Comput. Vis. Image Underst.
- Comput. Electron. Agric.
- EMBC
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- J. Vis. Commun. Image Represent.
- IEEE Trans. Vis. Comput. Graph.
- Int. J. Comput. Vis.
- CIC
- Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CGIV
- J. Electronic Imaging
- ICME
- Comput. Graph.
- SIGGRAPH Sketches
- IEEE Trans. Consumer Electron.
- DAGM-Symposium
- Image Vis. Comput.
- IEEE Signal Process. Lett.
- MVA
- Vis. Comput.
- EUSIPCO
- ICASSP
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