IMAGING CONDITIONS
Experts
- Tien-Tsin Wong
- Sven Loncaric
- Paul E. Debevec
- Abhijeet Ghosh
- Nikola Banic
- Brian V. Funt
- Chi-Sing Leung
- Qiang Ji
- Pieter Peers
- Katsushi Ikeuchi
- Reinhard Klette
- Shree K. Nayar
- Philippe Bekaert
- Carsten Dachsbacher
- Ramesh Raskar
- Yoichi Sato
- Jorge Urrutia
- Imari Sato
- Chengjun Liu
- Donald P. Greenberg
- Srinivasa G. Narasimhan
- Tze-Yui Ho
- Allen Y. Yang
- M. Salman Asif
- Simon Labouesse
- Jérôme Idier
- Vijayan K. Asari
- Peter N. Belhumeur
- Daijin Kim
- Jeff B. Pelz
- Marc Allain
- Tobias Ritschel
- Thorsten Grosch
- Reiner Lenz
- Kavita Bala
- Aly A. Farag
- Pheng-Ann Heng
- Graham D. Finlayson
- Jan Kautz
Venues
- CoRR
- ICIP
- CVPR
- Sensors
- Comput. Graph. Forum
- IEEE Access
- ICCV
- Multim. Tools Appl.
- ICPR
- Color Imaging Conference
- IEEE Trans. Image Process.
- Pattern Recognit.
- Pattern Recognit. Lett.
- Rendering Techniques
- ACM Trans. Graph.
- Comput. Electron. Agric.
- EMBC
- Comput. Vis. Image Underst.
- Int. J. Pattern Recognit. Artif. Intell.
- J. Vis. Commun. Image Represent.
- J. Electronic Imaging
- Remote. Sens.
- CIC
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Comput. Vis.
- CGIV
- ICASSP
- BMVC
- Vis. Comput.
- IEEE Trans. Vis. Comput. Graph.
- Image Vis. Comput.
- EUSIPCO
- ICME
- SIGGRAPH
- IEEE Trans. Consumer Electron.
- IEEE Signal Process. Lett.
- Comput. Graph.
- SIGGRAPH Posters
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