An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch.
Subhayu BasuIndranil SenguptaDipanwita Roy ChowdhurySudipta BhawmikPublished in: J. Electron. Test. (2002)
Keyphrases
- test cases
- test generation
- software testing
- test data
- high speed
- test sequences
- statistical tests
- test suite
- testing process
- structural equation modeling
- regression testing
- set of test cases
- integration testing
- test case generation
- test data generation
- lower cost
- access control
- factors affecting
- access control mechanism
- item response theory
- input output
- code coverage
- model based testing
- digital libraries