A Capture-Safe Test Generation Scheme for At-Speed Scan Testing.

Xiaoqing Wen Kohei Miyase Seiji Kajihara Hiroshi Furukawa Yuta Yamato Atsushi Takashima Kenji Noda H. Ito Kazumi Hatayama Takashi Aikyo Kewal K. Saluja

Published in: ETS (2008)