Improving the Performance of Automatic Sequential Test Generation by Targeting Hard-to-Test Faults.
Loganathan LingappanNiraj K. JhaPublished in: VLSI Design (2006)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- software testing
- symbolic execution
- design automation
- test suite
- test data generation
- regression testing
- code coverage
- static analysis
- fault diagnosis
- quality assurance
- case study
- object oriented
- computer vision
- fault detection
- feature selection
- testing process
- database
- feature space
- relational databases
- data sets