Enhanced IEEE 1500 test wrapper for testing small RAMs in SOCs.
Yu-Jen HuangYun-Chao YouJin-Fu LiPublished in: SoCC (2010)
Keyphrases
- test cases
- test generation
- black box
- software testing
- test suite
- test sequences
- test data
- test case generation
- statistical tests
- feature selection
- small number
- integration testing
- test data generation
- regression testing
- test driven development
- number of test cases
- test set
- information extraction
- decision trees
- testing process
- wireless lan
- model based testing
- search engine
- set of test cases
- information retrieval