A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults.
Fei WangYu HuHuawei LiXiaowei LiPublished in: ASP-DAC (2008)
Keyphrases
- model based diagnosis
- fault diagnosis
- fault detection
- digital circuits
- multiple faults
- model based reasoning
- analog circuits
- fault model
- design process
- fault isolation
- fault models
- case study
- logic circuits
- built in self test
- fault identification
- fault detection and isolation
- circuit design
- computer aided
- expert systems
- neural network
- medical diagnosis
- fault localization
- evolvable hardware
- test cases
- genetic algorithm
- real time
- root cause
- engineering design
- constraint programming
- power consumption
- data sets