Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing.
Xiaoqing WenKohei MiyaseTatsuya SuzukiSeiji KajiharaLaung-Terng WangKewal K. SalujaKozo KinoshitaPublished in: J. Electron. Test. (2008)
Keyphrases
- test generation
- test cases
- symbolic execution
- software testing
- test sequences
- information retrieval
- static analysis
- design automation
- quality assurance
- mutation testing
- code coverage
- test data generation
- regression testing
- query expansion
- software development
- information retrieval systems
- visual information
- video sequences
- high level
- computer vision