Optimal test-set generation for parametric fault detection in switched capacitor filters.
Wooyoung ChoiRamesh HarjaniBapiraju VinnakotaPublished in: Asian Test Symposium (2000)
Keyphrases
- test set
- fault detection
- training set
- fault diagnosis
- industrial processes
- error rate
- tennessee eastman
- fault identification
- failure detection
- condition monitoring
- training data
- test data
- class distribution
- fault detection and diagnosis
- fuel cell
- test cases
- data sets
- robust fault detection
- fault detection and isolation
- fault localization
- optimal solution
- power plant
- underwater vehicles
- evaluation methodology
- constraint satisfaction
- principal component analysis
- feature extraction
- genetic algorithm