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Observation Time Reduction for IDDQ Testing of Briding Faults in Sequential Circuits.
Yoshinobu Higami
Kewal K. Saluja
Kozo Kinoshita
Published in:
Asian Test Symposium (1998)
Keyphrases
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test cases
fault model
fault models
fault diagnosis
fault detection
correlation analysis
digital circuits
built in self test
test sequences
high speed
model based diagnosis
analog circuits
analog vlsi
multiple faults