Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set.
Hiroshi TakahashiYukihiro YamamotoYoshinobu HigamiYuzo TakamatsuPublished in: Asian Test Symposium (2004)
Keyphrases
- test set
- fault diagnosis
- error rate
- expert systems
- training set
- neural network
- multiple faults
- chemical process
- test data
- fault detection
- fault detection and diagnosis
- operating conditions
- bp neural network
- rbf neural network
- gas turbine
- power transformers
- fuzzy logic
- electronic equipment
- multi sensor information fusion
- training data
- monitoring and fault diagnosis
- failure diagnosis
- information fusion
- rotating machinery
- analog circuits
- condition monitoring
- real time
- power plant
- support vector machine
- fault detection and isolation
- tennessee eastman
- computer aided