BIST Test Pattern Generators for Stuck-Open and Delay Testing.
Chih-Ang ChenSandeep K. GuptaPublished in: EDAC-ETC-EUROASIC (1994)
Keyphrases
- test cases
- software testing
- test data
- test sequences
- built in self test
- test generation
- test suite
- pattern matching
- statistical tests
- regression testing
- test case generation
- integration testing
- usability testing
- statistical significance
- real time
- test set
- code coverage
- model based testing
- number of test cases
- set of test cases
- neural network