An oscillation-based test technique for on-chip testing of mm-wave phase shifters.
Marc Margalef-RoviraManuel J. BarraganEkta SharmaPhilippe FerrariEmmanuel PistonoSylvain BourdelPublished in: VTS (2018)
Keyphrases
- test cases
- test data
- software testing
- test generation
- statistical tests
- test suite
- low cost
- high speed
- test sequences
- set of test cases
- neural network
- integration testing
- regression testing
- physical design
- testing process
- test data generation
- item response theory
- test case generation
- learning phase
- evolutionary algorithm
- testing phase
- code coverage