On the Susceptibility of QDI Circuits to Transient Faults.
Raghda El ShehabyMatthias FüggerAndreas SteiningerPublished in: CoRR (2023)
Keyphrases
- built in self test
- fault models
- steady state
- fault diagnosis
- model based diagnosis
- fault detection
- analog circuits
- fault model
- tunnel diode
- high speed
- logic synthesis
- delay insensitive
- databases
- logic circuits
- shift register
- analog vlsi
- fault detection and diagnosis
- digital circuits
- circuit design
- test cases
- neural network
- abnormal events
- quantum computing
- integrated circuit
- multiple faults
- knowledge base
- high level synthesis
- real world