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- Marc Christie
- Senthil Kumar Yogamani
- Paolo Burelli
- Georgios N. Yannakakis
- Varun Ravi Kumar
- Hideo Saito
- Yuichi Ohta
- Shree K. Nayar
- Christophe Lino
- Atsushi Nakazawa
- Roberto Ranon
- William T. Freeman
- Antonio Torralba
- Jinwei Gu
- William H. Bares
- Itaru Kitahara
- Doron Feldman
- Akio Nakamura
- Paul E. Debevec
- Sahib Khan
- Terumasa Aoki
- Salvador Zaragoza
- Sidney S. Fels
- Roel Vertegaal
- Hiroshi Yasuda
- Yoshinori Kuno
- Takayuki Kitasaka
- Ciarán Eising
- Takashi Komuro
- Kunihito Kato
- Luisa Verdoliva
- Davide Cozzolino
- Kazuhiko Yamamoto
- Yeong Min Jang
- Shigang Li
- Francisco-José Mañas-Álvarez
- Ganesh Sistu
- Chen Change Loy
- Andrey Ignatov
Venues
- CoRR
- Sensors
- CVPR
- IROS
- CHI Extended Abstracts
- ICIP
- IEEE Access
- VR
- ICCV
- ICPR
- ICME
- ICRA
- ACM Trans. Graph.
- IEEE Trans. Instrum. Meas.
- Remote. Sens.
- MVA
- Smart Graphics
- ACM Multimedia
- IEICE Trans. Inf. Syst.
- IEEE Trans. Image Process.
- CVPR Workshops
- CHI
- IEEE Trans. Intell. Transp. Syst.
- VRST
- EUSIPCO
- IEEE Trans. Circuits Syst. Video Technol.
- Comput. Graph. Forum
- IGARSS
- Multim. Tools Appl.
- ITSC
- WACV
- IECON
- IEEE Trans. Pattern Anal. Mach. Intell.
- IVA
- ICAT
- Digit. Investig.
- Displays
- MIG
- IEEE Trans. Ind. Electron.
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